用Fourier分解法测量材料表面的Mueller矩阵

Teflon

用Fourier分解法测量材料表面的Mueller矩阵
Measurement of material surface＇s Mueller matrix by Fourier decomposition
作　　者：吴云智 魏庆农 汪世美 冯巍巍

WU Yun-zhi, WEI Qing-nong, WANG Shi-mei, FENG Wei-wei （ Key Laboratory of Environmental Optics ＆： Technology, Anhui Institute of Optics and Fine Mechanics Chinese Academy of Sicences, Hefei 230031, China ）

机构地区：中国科学院安徽光学精密机械研究所,中国科学院环境光学与技术重点实验室,安徽合肥230031

出　　处：《量子电子学报》 CAS CSCD 2007年第24卷第6期 714-720页,共7页

Chinese Journal of Quantum Electronics

摘　　要：测量系统采用双旋转延迟器结构，通过两个1／4波片的周期变化，对入射光、散射光的偏振态进行调制。由探测光强的25个Fourier分解系数可以计算得到样品的Mueller矩阵。为了检测测量系统的准确性，将测量的16个自由空间Mueller矩阵分量和理想情况下的自由空间Mueller矩阵分量进行比较，并给出了每个矩阵分量的标准误差。最后，通过测量聚四氟乙烯样品板的Mueller矩阵，定量地分析样品的退偏效应。

Dual rotating retarder configuration is applied in measurement system, whose incident and scattering light are modulated by synchronously rotating two quarter waveplates. From the 25 Fourier coefficients measured by performing Fourier decomposition of the signal, the 16 elements of sample＇s Mueller matrix are determined. We compare the experiment data of air with the ideal matrix to check the accuracy of measurement system, and present the standard error of each Mueller matrix element. Finally, the depolarization of polytetrafluoroethylene sample is analyzed quantitatively by the measured Mueller matrix.

关 键 词：光学偏振 Mueller矩阵 Fourier分解 聚四氟乙烯
optical polarization Mueller matrix Fourier decomposition polytetrafluoroethylene
分 类 号： TN249 [工业技术 > 无线电电子学、电信技术 > 光电子技术、激光技术 > 激光技术、微波激射技术]

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